Cover Story Advanced Test Part 1: Tame Wideband-CDMA Manufacturing Test
By Andrew O'Reilly
The efficient, accurate and repetitive test of wideband-CDMA equipment in the manufacturing environment is an incredibly complex task. Thankfully, certain features, or hooks, have been built into the W-CDMA specification that can help the designer achieve an optimum test environment.
Features Advanced Test Part 2: New Design-For-Test Strategies Tackle Comms IC Changes
By Scott Cook And Ron Press
For communications-IC designers, the combined challenges of multiple clock domains, high pin counts and increasing memory can be offset by the deft application of the latest DFT techniques, including advanced clock-compression, interaction analysis and Embedded Deterministic Test.
